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  4. A GaN-based currrent sense amplifier for GaN HEMTs with integrated current shunts
 
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2020
Conference Paper
Title

A GaN-based currrent sense amplifier for GaN HEMTs with integrated current shunts

Abstract
This work shows a GaN-based current sense amplifier as a read out circuit for a power GaN HEMT with integrated current shunt. In the GaN power transistor, the voltage drop of the outermost metal finger of a large-area comb structure effectively realizes a shunt acting as a current sensor. This small voltage drop of the integrated shunt (approx. 4 mV/A at 100 mOon-resistance) is amplified by a two-stage GaN-based amplifie rwith a gain of >40 dB at room temperature. The amplifier consisting of two series-connected differential amplifiers with source follower intermediate stages was verified in a double pulse test setup up to a peak current of 11.5 A. Consequently, the proposed current sense amplifier allows a simple and potentially integratable further processing for the monitoring or control ofthe current signal.
Author(s)
Basler, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mönch, Stefan  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Reiner, Richard  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Waltereit, Patrick  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Kallfass, Ingmar
Institute of Robust Power Semiconductor Systems
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
32nd International Symposium on Power Semiconductor Devices and ICs, ISPSD 2020. Proceedings  
Conference
International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2020  
DOI
10.1109/ISPSD46842.2020.9170047
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • gallium nitride

  • HEMTs

  • current measurement

  • sensors

  • logic circuits

  • amplifier

  • power integrated circuits

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